Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems (bibtex)

by Drechsler, Rolf

Reference:

Drechsler, Rolf, "Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems", In 2019 IEEE 28th Asian Test Symposium (ATS), pp. 159–1595, 2019.

Bibtex Entry:

@inproceedings{DG:2019,
  title={Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems},
  author={Drechsler, Rolf and Gro{\ss}e, Daniel},
  booktitle={2019 IEEE 28th Asian Test Symposium (ATS)},
  pages={159--1595},
  year={2019},
  organization={IEEE},
  url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8949397},
  keywords={easecrc_cognitive_arch_systems}
}